| 摘要 |
An improved near infrared spectrophotometer is disclosed which reduces wave shift errors arising from hot spots in a light source. A ground quartz plate uniformly diffuses radiation from the light source to evenly illuminate the entrance slit for a diffraction grating. Radiation emerges from the entrance slit with a uniform angular intensity distribution and is dispersed into a spectrum by a reflecting diffraction grating towards an exit slit. A narrow wavelength band of radiation passes through the exit slit to illuminate a sample. Because the entrance slit is uniformly illuminated, without regard to variations in radiation intensity due to hot spots in the source, wave shift errors in the reflectivity measurements for the sample are reduced.
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