发明名称 TEST DATA PREPARING METHOD AND TESTING METHOD
摘要 PURPOSE:To completely catch and detect data error and to improve reliability by generating discontinuous data pattern in a memory beforehand, reading out the data pattern of the memory with the added result of an adding part as a memory address and outputting a read result on trial. CONSTITUTION:A counter part 13 for address to be updated each time one byte is transferred, a counter part 14 for offset to be updated each time one sector is transferred, an adding part 15 to add the count output of the counter part 13 for address and the count output of the counter part 14 for offset, a memory 17 to store the data pattern are provided. When test data are prepared, the discontinuous data pattern is generated in the memory 17 beforehand and the data pattern of the memory 17 is read out with the added result of the adding part 15 as a memory address 16. Then, the read result is defined as a test output 18. Thus, the data error can be completely caught and detected and the reliability can be improved.
申请公布号 JPH03134869(A) 申请公布日期 1991.06.07
申请号 JP19890273443 申请日期 1989.10.20
申请人 FUJITSU LTD 发明人 TSUCHIYA HIDEAKI
分类号 G06F12/16;G06F11/22;G11B20/18 主分类号 G06F12/16
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