发明名称 Non-volatile semiconductor memory device with facility of storing tri-level data
摘要 A non-volatile memory cell includes a MOS transistor of double gate construction. The MOS memory transistor includes a floating gate structure which includes electrically separated first and second segmented floating gates (4a; 4b). For the purpose of writing data, electrons are independently injected into the first and second segmented floating gates. Data are stored in the MOS memory transistor in three different non-volatile storage levels; one with electron accumulated either one of the two segmented floating gates; another with electrons injected into both of the segmented floating gates; and still another with no electrons accumulated on both of the segmented floating gates.
申请公布号 US5021999(A) 申请公布日期 1991.06.04
申请号 US19880282456 申请日期 1988.12.09
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 KOHDA, KENJI;TOYAMA, TSUYOSHI;ANDO, NOBUAKI;NOGUCHI, KENJI;KOBAYASHI, SHINICHI
分类号 H01L21/8247;G11C11/56;G11C16/04;H01L29/788;H01L29/792 主分类号 H01L21/8247
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