| 摘要 |
A supporting plate holds a test device and is moved so that the pins of the device are electrically connected to a plurality of contact springs further connected to selected signal sources mounted on input and output boards. This approach avoids both using contact plates and an unduly long contact path between the test device and board, thereby minimizing parasitic inductance and capacitance. This provides improved test results for the devices tested and increased accuracy over well known types of sockets. The test socket design allows easy repair, maintenance and use which greatly increases test productivity and reliability.
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