发明名称 RECONSTRUCTABLE LOGIC INSPECTING APPARATUS
摘要 PURPOSE: To obtain a reconfigurable device by at least two inspection modules having a first switching matrix(SM) and a pin group electronic circuit - a pin electronic circuit connecting to a pin electronic circuit by the first switching matrix and a second SM and an inspection head connectable to a pin electronic circuit by the second SM. CONSTITUTION: An inspection device consists of a pin group electronic device 11 that can be multiplexed between two inspection bead configurations, inspection heads 13 and 15-17, and a pin electronic device 10. Then, when the device 10 is switched to a side A, three different devices perform inspection simultaneously and independently for the heads 15-17. In this case, 512 pins of the device 10 are divided into tow 128-pin inspection heads and one 256-pin inspection head. Also, when the device 10 is switched to a side B, one device is inspected and the 512-pin inspection head 13 is inspected, thus obtaining a reconfigurable device.
申请公布号 JPH03128473(A) 申请公布日期 1991.05.31
申请号 JP19900163043 申请日期 1990.06.22
申请人 TEXAS INSTR INC <TI> 发明人 MAAKU AARU MAIDEIRU;SAMU AARU PAIRU;SHIEIRA OKIIIFUE;NIIRU EFU OKAABUROMU;DABURIYU RASU KIINAN
分类号 G01R31/28;G01R31/319;G06F11/22 主分类号 G01R31/28
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