发明名称 BONDING EQUIPMENT AND BONDING METHOD
摘要 PURPOSE:To improve the reliability of a small-sized semiconductor device provided with many pins, by installing a second bonding tool to be adjacent to a first bonding tool, and making the width of a contact bonding part of the second bonding tool larger than that of the first bonding tool. CONSTITUTION:A first bonding tool 10 performs first bonding by connecting a bonding pad formed on a semiconductor chip 1 and a lead part 2 of a package by using a bonding wire 4a. A second bonding tool 11 for performing second bonding is installed so as to be adjacent to the first bonding tool 10. The width W2 of a contact bonding part 12a of the second bonding tool 11 is made larger than the width W1 of a contact bonding part 13a of the first bonding tool 10. Hence the area wherein the bonding wire 4a is contact-bonded to the lead part 2 by the second bonding tool 11 is larger than the area wherein the bonding is performed by the first bonding tool 10. As a result, ultrasonic wave is easily applied, and the bonding strength is increased. Thereby the reliability of a small-sized semiconductor device provided with many pins can be improved.
申请公布号 JPH03127844(A) 申请公布日期 1991.05.30
申请号 JP19890267760 申请日期 1989.10.13
申请人 FUJITSU LTD;SHINKO ELECTRIC IND CO LTD;KYUSHU FUJITSU ELECTRON:KK 发明人 SUWA MAMORU;WATANABE KOJI;SANO SHUNICHI;OYAMA NOBUO
分类号 H01L21/603;H01L21/60 主分类号 H01L21/603
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