METHOD OF MEASURING PERIOD OF SURFACE DEFECT,申请号EP19890116688-传众专利搜索

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发明名称	METHOD OF MEASURING PERIOD OF SURFACE DEFECT
摘要
申请公布号	EP0358236(A3)	申请公布日期	1991.05.29
申请号	EP19890116688	申请日期	1989.09.08
申请人	FUJI PHOTO FILM CO., LTD.	发明人	KISO,TAKESHI C/O FUJI PHOTO FILM CO., LTD.;MASUDA, TAKANORI C/O FUJI PHOTO FILM CO., LTD.
分类号	G01B11/30;G01N21/88;G01N21/89;G01N21/892;(IPC1-7):G01N21/89;G06F15/336	主分类号	G01B11/30
代理机构		代理人
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