发明名称 EM tolerance test chamber for electrical appts. - sets max. resonance field strength for desired test frequency by moving wall
摘要 The chamber tests the e.m. tolerance of electrical appts., components and systems using a metallic enclosed chamber screening and generators of e.m. E and H test fields. The test chamber (1) has a screened, slidable wall (2) in electrically conductive contact with the screening (7) of fixed walls (4), base (5) and lid surfaces (6) via spring contacts (3). By changing the position of the movable wall and the object under test (8) a max. resonance field strength for the desired test frequency can be set. E and H antennae are provided for feeding the test fields. ADVANTAGE - Higher test field strength.
申请公布号 DE3938239(A1) 申请公布日期 1991.05.23
申请号 DE19893938239 申请日期 1989.11.17
申请人 TELEFUNKEN SYSTEMTECHNIK GMBH, 7900 ULM, DE 发明人 NEDTWIG, JOACHIM, DIPL.-ING., 7900 ULM, DE
分类号 G01R29/08 主分类号 G01R29/08
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