发明名称 3 point bending measuring system.
摘要 <p>A sample holder for use with a bending measuring system. A probe shaft (14) is disposed in an elongated tube (11). A probe tip (15) is removeably mounted at one end of the probe shaft. The other end (14a) of the probe shaft is adapted to be fixed to the bending measuring system. A double knife edge platform (16) supports a sample (17) at each end and the probe tip (15) contacts the sample at its center. Proper alignment between the sample and probe tip is obtained by having means which permit radial adjustment of the platform and rotation of the probe shaft about its central axis.</p>
申请公布号 EP0428010(A2) 申请公布日期 1991.05.22
申请号 EP19900120859 申请日期 1990.10.31
申请人 THE PERKIN-ELMER CORPORATION 发明人 MCKINLEY, KERRY;TWOMBLY, BENJAMIN
分类号 G01N3/04;G01N3/20 主分类号 G01N3/04
代理机构 代理人
主权项
地址