发明名称 |
Method and apparatus for detecting oscillator stuck faults in a level sensitive scan design (LSSD) system. |
摘要 |
<p>A method and apparatus for identifying stuck faults in an oscillator used for providing a oscillator input signal (12) to an integrated circuit chip of the type conforming to a Level Sensitive Scan Design (LSSD) system and testing technique. A pair of shift register latches (SRLs) (20,30) are provided in the integrated circuit chip having a logical one signal applied to a data input of the SRLs. The oscillator input signal is applied to a data clock input of a first one (20) of the SRLs and an inverted oscillator input signal is applied to the data clock input of a second one (30) of the SRLs. Then the scan data output (SDO) of the test SRLs is detected responsive to the applied oscillator and inverted oscillator input signals to identify a stuck fault.</p> |
申请公布号 |
EP0428465(A2) |
申请公布日期 |
1991.05.22 |
申请号 |
EP19900480157 |
申请日期 |
1990.10.09 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
BORKENHAGEN, JOHN MICHAEL;DOUSKEY, STEVEN MICHAEL;MEYER, JEROME MARTIN |
分类号 |
G01R31/28;G01R31/00;G06F11/16;G06F11/22;G06F11/267 |
主分类号 |
G01R31/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|