| 摘要 |
PURPOSE:To monitor the abnormality of a temporary storage circuit by putting the test data into an idle time slot to write it into the temporary storage circuit and collating this test data with the data read out of the temporary storage circuit. CONSTITUTION:The head pointing information is separated from the input data D1 by a head pointing information detecting circuit 21 of a head pulse writing means 2. Then the data D1 is converted into a head pointing pulse P by a head pointing pulse generating circuit 22 and written into a temporary storage circuit 1. Meanwhile the time slot so far contained the head pointing information becomes empty in terms of the data D1. Thus the test data produced by a test data generating circuit 3 is put into the idle time slot via a selection circuit 4 and then written into the circuit 1. At the same time, the data read out of the circuit 1 are collated with each other via a test data collation circuit 6 for check of the action of the circuit 1. Thus the abnormality of the circuit 1 is monitored. |
