| 摘要 |
<p>A method of localized spectroscopic analysis of the light diffracted or absorbed by a transparent and/or reflective substance placed in a near field generated by the transmission or reflection of a first electromagnetic radiation, characterized in that a localized spectroscopic analysis is made of said near field and/or of a second magnetic radiation which is directed at the same time as said first radiation at said substance, said analysis being related to the fraction of said near field or of said second electromagnetic radiation which has interacted with said substance. The invention relates in particular to a high-resolution spectroscopic study of transparent and/or reflective substances whose optical or geometric profile is simultaneously determined by means of a near field scanning optical microscope such as a frustrated vanishing field transmission microscope or a guided near field reflection microscope.</p> |
