发明名称 METHOD FOR RADIATION DETECTION AND MEASUREMENT
摘要 <p>M-center luminescence is used to measure radiation. An LiF crystal (20) is excited with a 442 nm He-Cd laser because absorption measurements in LiF indicate the peak of the M-center absorption occurs at 443 nm. Laser stimulation produces an excited state of the M-center, which undergoes a very strong Stokes' shift. The peak of the M-center emission spectrum occurs at 665 nm with a half-width of 0.36 ev. Since the excitation wavelength differs significantly from the emission wavelength, measurement of the deep red emission can be done simultaneously with the excitation. The population of M-centers grows with increasing radiation damage, and therefore M-center luminescence provides a basis for radiation dosimetry.</p>
申请公布号 WO1991006875(A2) 申请公布日期 1991.05.16
申请号 US1990006316 申请日期 1990.10.31
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