| 摘要 |
<p>A test fixture (10) which includes a base portion (12) and upstanding successive side walls (16, 17 and 18) integral with the base portion (12). Lateral grooves (22, 24, 26) extend around the inner surface of the three side walls (16, 17 and 18). A first movable clamp (30) is positioned between opposing side walls (16 and 18) and is movable in a selected slot (22, 24, 26) toward and away from the intermediate side wall (17). A second movable clamp (80) is mounted on and movable along the first clamp (30) and extends a small distance in the direction of the intermediate side wall (17). A circuit board (90) to be tested is typically clamped between the side walls (16 and 17) and the first and second clamps (30 and 80). A test probe (130) is positioned in a holder (91) which is mounted for movement between the first and third side walls (16 and 18) and toward and away from the second intermediate side wall (17). The position of the probe holder (91) relative to the board (90) is recognized by an optics system (142).</p> |
