发明名称 Reflected light measuring instrument.
摘要 <p>Disclosed herein is a reflected light measuring instrument for receiving reflected light from an object under measurement, which has an effect that even if a reflection surface of the object under measurement shifts in position in the direction of an optical axis, a quantity of reflected light at the reflection surface is automatically corrected to be substantially constant, whereby the read accuracy on said reflection surface is not lowered at all.</p>
申请公布号 EP0426047(A2) 申请公布日期 1991.05.08
申请号 EP19900120629 申请日期 1990.10.27
申请人 TERUMO KABUSHIKI KAISHA;YAMATAKE-HONEYWELL CO., LTD. 发明人 SUZUKI, YOSHIRO;MURATA, KAZUHIKO;MIURA, SATOSHI;KAWADA, YASUSHI
分类号 G01N33/49;G01N21/47;G01N21/78 主分类号 G01N33/49
代理机构 代理人
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