发明名称 D.C. biasing apparatus
摘要 For measuring the inductance of a workpiece, a device which includes an inductance meter, respective D.C. and A.C. power sources as well as a guard line circuit. In order to simulate conditions of actual use of the workpiece, the D.C. power source is connected to provide a direct current bias through the workpiece. A measuring current produced by the A.C. power source and applied to the workpiece is detected via the inductance meter. The guard line circuit is coupled so as to prevent any portions of the A.C. measuring signal from undesirably flowing through the D.C. power source.
申请公布号 US5014012(A) 申请公布日期 1991.05.07
申请号 US19890374117 申请日期 1989.06.30
申请人 HEWLETT-PACKARD CO. 发明人 KUBOYAMA, YOICHI;YANAGAWA, KOICHI
分类号 G01R27/02;G01R27/26 主分类号 G01R27/02
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