| 摘要 |
<p>Fail information from testing of a DUT memory array is captured and compressed by utilizing a compression matrix which is related in size to the available redundancy associated with the DUT (device under test) memory array, and which, in essence, defines the limits of redundancy repair. The compression matrix includes a plurality of matrix cells fewer in number than the number of memory cells in the DUT memory array and is arranged in a matrix of compression rows and compression columns. The compression matrix is loaded with the fail information concurrently with testing of the DUT memory array. There are also provided column and row selects for storing, and assigning to each compression column or row of at least a portion of the compression columns and rows, a different column or row-address portion of the fail information, and for providing selection of compression columns and rows according to stored column and row address portions. Comparators compare, for each compression and column, a count of matrix cells set along each column and row to a predetermined redundancy value, and, when the count becomes greater than the redundancy value, there is a designation of a memory array column or row as a "must fix", and there is a blockage of storage of row-address or column-address portions, respectively, of fail information having the same column-address or row-address portion as that of the column or row that has been designated as a "must fix".</p> |
