发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE:To make a cell ratio of a driver MOST and to realize a high integration of a memory cell by a method wherein the driver MOST is formed as a buried channel type MOST and a transfer MOST is formed as a surface channel type MOST. CONSTITUTION:A driver MOST is constituted as a buried channel and a transfer MOST is constituted as a surface channel. While a buried layer does not exist under a gate electrode 3' of the transfer MOST, an n-type buried layer exists under a gate electrode of the driver MOST. In addition, when a gate electrode 3' of the buried channel type MOST is constituted of a p-type semiconductor and a gate electrode 3 of the surface channel type MOST is constituted of an n-type semiconductor, a threshold voltage of the individual MOST's can be adjusted to a desired value. By this constitution, a gate width of the driver MOST can be made small while a cell ratio of a memory cell is being secured; as a result, a high integration can be realized easily.
申请公布号 JPH03105970(A) 申请公布日期 1991.05.02
申请号 JP19890242128 申请日期 1989.09.20
申请人 HITACHI LTD 发明人 MATSUZAKI NOZOMI;HONMA HIDEO;NAGANO TAKAHIRO
分类号 H01L27/11;H01L21/8244 主分类号 H01L27/11
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