发明名称 Delay measuring circuit.
摘要 <p>In a delay measuring circuit (10), an input clock signal (13) is applied to a multitapped delay line (14), the output taps of which are connected to a switch (26) which selects one of the switch inputs for connection to a phase comparator (34) which compares the input clock signal (13), delayed in a delay device (38) to compensate for the delay inherent in the switch (26), with the output of the switch (26). The input clock signal is also applied to a counter (22), and when the phase comparator (34) detects a phase match, the counter value is stored in a latch (32), the counter 122) is reset to a predetermined value, and the counting procedure resumed. The latch (32) thus always stores a value dependent on the delay of an individual delay cell (16-1 to 16-N). This stored value can be applied to various uses, such as in a timing watchdog circuit or for generating accurate delays.</p>
申请公布号 EP0425303(A2) 申请公布日期 1991.05.02
申请号 EP19900311759 申请日期 1990.10.26
申请人 NCR CORPORATION 发明人 VAN DRIEST, HANS;KRUITHOF, RICHARD;VAN BOKHORST, HENDRIK
分类号 G01R25/08;G01R29/027 主分类号 G01R25/08
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