发明名称 METHOD AND APPARATUS FOR ANALYZING PAPER QUALITY
摘要 The invention relates to a method and apparatus for analyzing paper quality, where the radiation obtained from a radiation source (1) is allowed to be transmitted through a paper sample (2) under examination, the absorption of the sample is measured, and on the basis of this measurement, there are defined characteristic features for the sample, which features describe the paper quality and by means of which the paper quality is assessed. In this method the sample (2) under examination is pictured as a two-dimensional image by means of a camera (3), which image is then analyzed sub-part by sub-part, and the said features are defined for it. The image is recorded in a memory (4) and treated as a matrix in an analyzing unit (5). The matrix is analyzed by defining characteristic features for it, so that the matrix is observed sub-part by sub-part, starting from the whole image and by advancing towards the meanest spatial resolution, which corresponds to the smallest sensor resolution in the matrix; there is formed a table of the variances for each sub-part of the matrix, particularly for the spatial resolution; and the employed variance is the variance of radiation intensity transmitted to each sub-part. The readings contained in each table correspond to the said features, whereby the paper quality is assessed.
申请公布号 WO9105997(A1) 申请公布日期 1991.05.02
申请号 WO1990FI00238 申请日期 1990.10.11
申请人 VALTION TEKNILLINEN TUTKIMUSKESKUS 发明人 VISA, ARI;DAUM, WERNER
分类号 G01N15/14;G01N21/86 主分类号 G01N15/14
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