发明名称 Double-die semiconductor package having a back-bonded die and a face-bonded die interconnected on a single leadframe
摘要 A semiconductor package incorporating a pair of semiconductor dice on a single leadframe of the type having a wire-bonding region at each end of a die-attachment region which has both an upper and lower surface. The first of said pair of dice is back bonded to the upper surface of said die-attachment region; the second is face bonded to the lower surface of said die-attachment region. Electrical interconnections between said second die and said leadframe pass through an aperture in the leadframe. The dual-die package can be used to approximately double circuit density in a number of different packages, including a dual inline package (DIP), a small-outline J-lead package (SOJ), a single inline package (SIP), zig-zag inline package (ZIP), and other variations of the single- and double-row inline-lead packages.
申请公布号 US5012323(A) 申请公布日期 1991.04.30
申请号 US19890439243 申请日期 1989.11.20
申请人 MICRON TECHNOLOGY, INC. 发明人 FARNWORTH, WARREN M.
分类号 H01L23/495 主分类号 H01L23/495
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