发明名称 SEMICONDUCTOR MEMORY
摘要 PURPOSE:To reduce the breakdown of capacitor insulating films upon patterning of a cell plate electrode, and to improve the yield by dividing the cell plate electrode of a memory cell capacitor in a memory cell array into a plurality of pieces in a semiconductor memory where a cell plate electrode is to be patterned by plasma treatment. CONSTITUTION:Numeral 1 represents memory cell array, 2 eight-split cell plate electrodes, 3 row address decoder, 4 column address decoder, 5 and 6 word line and bit line respectively, 7 sense amplifier, and 8 contact. Contacts 8 are positioned at positions to eight-divide a word line 5, and the memory cell array 1 is eight-divided as well as the cell plate electrode 2, so that its size is 1/8 that of a conventional example. Therefore, current flowing through the capacitor insulating film during plasma treatment reduces to 1/8. That is, it is possible that the lifetime up to breakdown extends eight times.
申请公布号 JPH03102870(A) 申请公布日期 1991.04.30
申请号 JP19890240159 申请日期 1989.09.18
申请人 MATSUSHITA ELECTRON CORP 发明人 SHIMANO AKIO
分类号 H01L21/822;H01L21/8242;H01L27/04;H01L27/10;H01L27/108 主分类号 H01L21/822
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