发明名称 Electrooptic effect element and electrical signal waveform measuring apparatus using the same
摘要 PCT No. PCT/JP89/01071 Sec. 371 Date Jul. 10, 1989 Sec. 102(e) Date Jul. 10, 1989 PCT Filed Oct. 21, 1988 PCT Pub. No. WO88/12831 PCT Pub. Date Dec. 28, 1989.An electrooptic effect element of this invention has first, second, and third electrodes. The first and second electrodes are formed on a substrate having an electrooptic effect, in order to form a high-frequency electric field for polarizing a light beam, thus constituting a microstrip line, as in the conventional element. The third electrode is spaced apart from the second electrode on the substrate in order to form another electric field for canceling the polarized light by the high-frequency electric field. In an electrical signal waveform measuring apparatus of this invention, an electrical signal obtained from an optical detection system coupled to the electrooptic effect element is fed back to form a closed loop in the third electrode.
申请公布号 US5012183(A) 申请公布日期 1991.04.30
申请号 US19890391548 申请日期 1989.07.10
申请人 ANRITSU CORPORATION 发明人 KAWANO, YOUZO;TAKAHASHI, TADASHI;SHIMURA, YASUHIKO;TAKAHASHI, YUKIHIRO
分类号 G01R13/34;G01R15/24 主分类号 G01R13/34
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