PRODUCING METHOD OF LSI TEST PATTERN

摘要

PURPOSE:To enable automatic extraction of a test pattern for an LSI unit on the basis of accumulated test informations by giving a function of extracting each input-output signal of LSI by device simulation. CONSTITUTION:Consideration is given to the case of producing a test pattern for a unit test of LSI 4. A device is represented in a logic file 1. This is simulated by a simulator 2 and the result 3 of simulation is outputted. This result 3 of simulation is processed by a test pattern producing program and thereby the test pattern 5 is produced. This test pattern 5 can be used for a test for reception of the LSI.