发明名称 TOTAL REFLECTION X-RAY FLUORESCENCE APPARATUS
摘要 A total reflection X-ray fluorescence apparatus comprises a base material (6) having an optically flat surface for totally reflecting X-rays radiated at a small glancing angle, a first detector (13) such as an SSD for detecting fluorescent X-rays emerging from a specimen (7) located near the optically flat surface of the base material (6) and a second detector (11) such as a scintillation counter for detecting an intensity of an X-rays coming from the base material (6).
申请公布号 AU6479890(A) 申请公布日期 1991.04.26
申请号 AU19900064798 申请日期 1990.10.16
申请人 SUMITOMO ELECTRIC INDUSTRIES 发明人 TETSUYA OHSUGI;MICHIHISA KYOTO;KAZUO NISHIHAGI
分类号 G01N23/22 主分类号 G01N23/22
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