发明名称 |
TOTAL REFLECTION X-RAY FLUORESCENCE APPARATUS |
摘要 |
A total reflection X-ray fluorescence apparatus comprises a base material (6) having an optically flat surface for totally reflecting X-rays radiated at a small glancing angle, a first detector (13) such as an SSD for detecting fluorescent X-rays emerging from a specimen (7) located near the optically flat surface of the base material (6) and a second detector (11) such as a scintillation counter for detecting an intensity of an X-rays coming from the base material (6). |
申请公布号 |
AU6479890(A) |
申请公布日期 |
1991.04.26 |
申请号 |
AU19900064798 |
申请日期 |
1990.10.16 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES |
发明人 |
TETSUYA OHSUGI;MICHIHISA KYOTO;KAZUO NISHIHAGI |
分类号 |
G01N23/22 |
主分类号 |
G01N23/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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