发明名称 LOW-TEMPERATURE ETCHING DEVICE FOR SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE:To reduce the damage of a semiconductor substrate and further to improve the controllability in etching processing by providing a vacuum chamber, which can control the temperature of the semiconductor substrate, between reaction chambers. CONSTITUTION:A vacuum chamber 4 doubling as a transfer chamber, which can control the temperature of a semiconductor substrate, is provided between reaction chambers 1 and 2. And the temperature of semiconductor substrate is raised from low temperature to high temperature by nitrogen for cooling and a lamp heater 5 for heating.</p>
申请公布号 JPH03101224(A) 申请公布日期 1991.04.26
申请号 JP19890237235 申请日期 1989.09.14
申请人 MATSUSHITA ELECTRON CORP 发明人 DOMAE SHINICHI
分类号 H01L21/302;H01L21/3065;H01L21/677;H01L21/68 主分类号 H01L21/302
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