METHOD OF MEASURING LOCAL TEMPERATURE OF SAMPLE FOR ELECTRON MICROSCOPE,申请号JP19890237983-传众专利搜索

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发明名称	METHOD OF MEASURING LOCAL TEMPERATURE OF SAMPLE FOR ELECTRON MICROSCOPE
摘要
申请公布号	JPH03101039(A)	申请公布日期	1991.04.25
申请号	JP19890237983	申请日期	1989.09.13
申请人	JEOL LTD	发明人	URA KATSUMI;TAKAOKA AKIO
分类号	H01J37/20;H01J37/244	主分类号	H01J37/20
代理机构		代理人
主权项
地址

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