| 摘要 |
<p>Incident slits (W1 - W4) and exiting slits (W5 - W8) are provided separately on the corresponding optical axes (a/ &cir& , b/ &cir& , c/ &cir& , d/ &cir& ) incident simultaneously on a spectroscope (10) from a sample atomizing unit (7). A mechanism (11a - 11d, 31a - 31d; 17a, 17b, 31e, 31f) for changing the widths of the respective incident slits (W1 - W4( and exiting slits (W5 - W8) is provided such that the slit widths optimal to the respective elements to be measured are set on the corresponding optical axes to thereby realize high sensitivity analysis of all the elements to be measured simultaneously.</p> |
