发明名称 Improved method of epitaxially vapour depositing semiconductor material
摘要 In a method of epitaxially depositing a semi-conductor material on to a semi-conductor substrate, the deposition is temporarily stopped. A silicon or germanium substrate is heated by R.F. coils in a quartz chamber and a gaseous mixture of hydrogen and silicon tetrachloride is passed through the chamber to deposit silicon on the substrate, after, e.g. 1/2 to 5 minutes, the flow of vapour is stopped and hydrogen only is passed through the chamber, after 5 minutes, the flow of vapour is recommenced and the deposition of silicon resumed. The substrate may have antimony as an impurity.ALSO:In a method of epitaxially depositing a semi-conductor material on to a semi-conductor substrate the deposition is temporarily stopped. A silicon or germanium substrate is heated by R.F. coils in a quartz chamber and a gaseous mixture of hydrogen and silicon tetrachloride is passed through the chamber to deposit silicon on the substrate, after, e.g. 1/2 to 5 minutes, the flow of vapour is stopped and hydrogen only is passed through the chamber, after 5 minutes, the flow of vapour is recommenced and the deposition of silicon resumed. The substrate may have antimony as an impurity.
申请公布号 GB1056720(A) 申请公布日期 1967.01.25
申请号 GB19650036219 申请日期 1965.08.24
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人
分类号 C30B25/02;H01L21/00 主分类号 C30B25/02
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