发明名称 Diamond probe and forming method thereof
摘要 The present invention provides a method of manufacturing a probe having an extremely hard and acute tip, which involves the steps of precipitating a carbon film mixed with a columnar diamond crystal and an amorphous carbonic component at a tip of a probe material; and protruding the columnar diamond crystal by selectively etching the amorphous carbonic component. According to the present invention, it is possible to improve a resolving power of the analyzing device and probe durability as well.
申请公布号 US5010249(A) 申请公布日期 1991.04.23
申请号 US19890406458 申请日期 1989.09.13
申请人 SEIKO INSTRUMENTS INC. 发明人 NISHIKAWA, AKIRA
分类号 G01B7/34;G01N23/00;G01Q60/16;G01Q70/14;H01J1/304;H01J9/02 主分类号 G01B7/34
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