METHOD OF TESTING INTEGRATED CIRCUIT DEVICE AND INTEGRATED CIRCUIT DEVICE PREFERRED TO BE TESTED BY THE SAME

摘要

PURPOSE: To generate a test pattern and conduct a test in a short time by selectively testing respective specified macros or bypassing the macros under the control of an overall macro test mode control signal. CONSTITUTION: A test control block TCB 110 receives signals MTR, MTM, and MTE from an overall control level and sends a ready signal READY back. This TCB 110 sends a signal Pro-ena to TCBs 112 and 114 of next low level and receives signals Ready from the TCBs 112 and 114. The TCBs 112 and 114 receive overall control signals MTR and MTM having no index and control processors 116 and 118 respectively. The processors 116 and 118 receives bus control block BCB control signals from the TCBs 112 and 114 and control output buffers 132 and 134 to send a bus control block signal to a BCB control bus 136.