发明名称 METHOD OF INSPECTING JUNCTION
摘要 PURPOSE: To confirm the type of a fault by representing an image of plural leads of an electronic component with polygonal segments and comparing the value of the intensity of a pixel in each polygon with a model waveform corresponding to a measurement waveform projected on respective dimensional axes. CONSTITUTION: The image of the plural lead wires of an electronic component connection part is formed, each image is divided into segments to calculate a luminance threshold value, and a subject area where the luminance value of a pixel exceeds a threshold value is made distinctive as a background area where the luminance value of a pixel is less than the threshold value. Further, a polygon, e.g. a square showing a border as to each area obtained the subject area by chained coding is calculated and a cluster of rectangles is made to form an area showing the lead wires. Then luminance of gray level is projected on an axis parallel to the axis of the image and projection waveforms are put one over the other and compared with the model waveform corresponding to the measurement waveform of each rectangle.
申请公布号 JPH0396875(A) 申请公布日期 1991.04.22
申请号 JP19900226405 申请日期 1990.08.28
申请人 HEWLETT PACKARD CO <HP> 发明人 HAINTSU BUROI
分类号 G01R31/04;B23K31/12;G01N21/956;G06T1/00;G06T7/00;H05K3/34;H05K13/08 主分类号 G01R31/04
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