发明名称 SCANNING SENSOR SYSTEM INCLUDING AN INTERFEROMETER
摘要 <p>An on-line scanning sensor system (fig. 1) includes a mid-infrared spectrophotometric analyzer (fig. 2), such as an interferometer, that can be used on-line in manufacturing environments. More particularly, the on-line scanning sensor system includes a first carriage (36) for scanning motion across a traveling sheet of material (30); interferometer components that are carried by the first carriage and that include devices for splitting and recombining infrared light (51), and for directing a collimated beam of the recombined light onto a traveling web of sheet material (58). Further, the system includes a detector system (62) for receiving light from the interferometer components during scanning.</p>
申请公布号 WO1991005217(A1) 申请公布日期 1991.04.18
申请号 US1990005571 申请日期 1990.10.04
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