| 摘要 |
PCT No. PCT/GB90/01407 Sec. 371 Date May 6, 1992 Sec. 102(e) Date May 6, 1992 PCT Filed Sep. 12, 1990 PCT Pub. No. WO91/04507 PCT Pub. Date Apr. 4, 1991.In a method and apparatus for examining samples comprising individual objects (28) of macromolecular or similar size, or smaller, an instrument element (14) comprises a substrate (16) overlaid with a thin film layer (18) of a material that is electrically conductive and/or at last partly optically opaque. A discontinuity comprising an aperture (26) or an asperity is formed in or on the element (14) in a known location, and the sample (28) is brought to this discontinuity so that it is not necessary to search for the sample by scanning. Energy (e.g. electrical energy or light) is applied to the element (14) and, with the latter and the sample in intimate association, e.g. with the sample inside the aperture (26), changes in the radiation from the sample site resulting from the presence of the sample are detected. |
