发明名称 |
Exposure method and apparatus |
摘要 |
An enlargement projection type exposure method includes the steps of deforming the shape of a substrate so as to eliminate distortion in an enlarged image of the pattern, which is formed on a mask and projected onto the substrate through an enlargement projection system. The pattern is exposed with the use of an enlargement projection optical system. An apparatus for the method comprises an enlargement projection optical system for enlarging the pattern formed on the mask, and a substrate deforming device for deforming by adsorption the substrate in shape so as to eliminate the distortion in the enlarged image of the pattern through the enlargement projection optical system.
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申请公布号 |
US5008702(A) |
申请公布日期 |
1991.04.16 |
申请号 |
US19890401619 |
申请日期 |
1989.08.31 |
申请人 |
HITACHI, LTD. |
发明人 |
TANAKA, TSUTOMU;OSHIDA, YOSHITADA;SHIBA, MASATAKA;NAKASHIMA, NAOTO;FUNATSU, RYUICHI |
分类号 |
G03F7/20;H01L21/027;H01L21/30 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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