| 摘要 |
PURPOSE:To eliminate the necessity of an external terminal exclusive for a test and to make an integrated circuit compact by separating one of a processing circuit and peripheral circuits from the other circuit corresponding to a control signal to be outputted from a test mode setting circuit and setting the circuit in a state that single test operation can be executed. CONSTITUTION:A test mode setting circuit 14 receives a signal for a test at specified timing, which is different from timing at the time of real use, to be inputted from the external terminal to be used at the time of the real use, and corresponding to the control signal to be outputted from this test mode setting circuit 14, one of a processing circuit 1 and peripheral circuits 2a-2c is separated from the other circuit by a signal control circuit 3 and set in the state that the single test operation can be executed. Thus, in order to execute the single test of the processing circuit 1 or the peripheral circuits 2a-2c, the necessity of the external terminal exclusive for the test is eliminated and an external dimension is suppressed to be small. |
