发明名称 METHOD AND INSTRUMENT FOR MEASURING REVERSE SURFACE SHAPE WITH ULTRASONIC WAVE
摘要 PURPOSE:To precisely measure the shape of a reverse surface by setting the recognition ranges of a delay material contact surface and the top and reverse surfaces of a body to be measured with the length of a delay material, measuring pieces of information on the amplitude and time of a reflection waveform at its peak position, and calculating the thickness of the body to be measured. CONSTITUTION:The ultrasonic wave is sent out of an ultrasonic wave sensor 4 and its reflection waveforms from the delay material contact surface 8 and the top and reverse surfaces 3 and 9 of the body to be measured are received by an ultrasonic transmitter-receiver 5, A/D-converted, and inputted to a computer 13. Here, the recognition range of the contact surface and top surface is set previously with the length of the delay material 7 and the peak position in the range is retrieved to measure the amplitude level and time information. Then the reverse surface recognition range is set based upon the top surface waveform to measure the amplitude level and time information at the peak position of the reverse surface waveform, and the thickness is calculated from the time interval between the peaks of the top surface and reverse surface waveforms. Then the sensor 4 is moved to calculate the thickness continuously and variation of the reverse surface shape due to corrosion is precisely measured.
申请公布号 JPH0384407(A) 申请公布日期 1991.04.10
申请号 JP19890221094 申请日期 1989.08.28
申请人 NIPPON CHIYOUONPA SHIKEN KK;SANIIDA:KK 发明人 NATORI TAKAO
分类号 G01B17/02;G01B17/08;G01N29/22;G01N29/44 主分类号 G01B17/02
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