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发明名称
IC TEST EQUIPMENT
摘要
申请公布号
EP0382264(A3)
申请公布日期
1991.04.10
申请号
EP19900105386
申请日期
1985.06.27
申请人
ADVANTEST CORPORATION
发明人
SATO, HIROSHI;KOBAYASHI, YOSHIHITO
分类号
B07C5/344;G01R31/28;(IPC1-7):G01R31/28
主分类号
B07C5/344
代理机构
代理人
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