| 摘要 |
A method of testing for short circuits between networks of a printed circuit board comprising a plurality of such networks comprises measuring an impedance value between each of the networks and a ground plane of the board, using a pair of probes; and, also using the probes, effecting tests for short circuits only between any two networks for which the measured impedance value is substantially the same and for which this measured impedance value is greater than a predicted lowest impedance for the two networks to be short-circuited together.
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