Module for preventing instability in integrated circuit testers

摘要

A module for preventing instability in systems which test integrated circuit chips resides between the tester unit and the chip that is being tested. This module is characterized as including a plurality of phase-shifting circuits which couple respective output signals from output transistors on the chip onto signal lines to the tester unit. Each phase-shifting circuit includes an inductor which counteracts and cancels any capacitive phase shift that is produced by the input impedance of the corresponding signal line to the tester unit.