| 摘要 |
The present disclosure relates to an infrared ray moisture meter which measures moisture of paper using absorption of infrared rays, and more particularly to an infrared ray moisture meter in which penetration and scattering by paper is done enough independent of whether the paper is thin or thick, the sensitivity of which is high, and in which attenuation of rays is small and error of measurement with respect to misalignment in the XY direction is small, and at the same time, which lowers the influence of the quality of the paper by applying to the paper infrared rays which are sensitive to moisture, infrared rays which are sensitive to cellulose, and infrared rays which are sensitive neither to moisture nor cellulose and by computing using detection output by the infrared rays. <IMAGE> |
