发明名称 MANUFACTURE OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PURPOSE:To obtain a shallow or deep impurity introduction layer arbitrarily by a method wherein an electrode material is mounted on an oxide film of Si substrate surface to remove the oxide film and thereafter an ion implantation is provided therefor uniformly. CONSTITUTION:A polysilicon gate electrode 4 is formed on a gate oxide film 3 by using resist 5 and a polysilicon film 7 on a separating oixde film 2 is covered with resist 8 to surround around MOSEFT portion. When the oxide film 3 is removed and thereafter n type impurity ion is implanted, a shallow source-drain layer 6c and a deep diffusion resistance layer 6b are formed. According to such a constitution, the IC having the impurity layers of different depth can be obtained while eliminating a troublesome processing such as increasing of diffusion process or mask alignment, etc.
申请公布号 JPS57153462(A) 申请公布日期 1982.09.22
申请号 JP19810041407 申请日期 1981.03.18
申请人 MITSUBISHI DENKI KK 发明人 SATOU SHINICHI;KOTANI HIDEO;DENDA MASAHIKO;OOHAYASHI YOSHIKAZU;MIZUGUCHI KAZUO
分类号 H01L27/04;H01L21/265;H01L21/266;H01L21/28;H01L21/306;H01L21/822;H01L21/8234;H01L27/06;H01L29/78 主分类号 H01L27/04
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