发明名称 |
MANUFACTURE OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE |
摘要 |
PURPOSE:To obtain a shallow or deep impurity introduction layer arbitrarily by a method wherein an electrode material is mounted on an oxide film of Si substrate surface to remove the oxide film and thereafter an ion implantation is provided therefor uniformly. CONSTITUTION:A polysilicon gate electrode 4 is formed on a gate oxide film 3 by using resist 5 and a polysilicon film 7 on a separating oixde film 2 is covered with resist 8 to surround around MOSEFT portion. When the oxide film 3 is removed and thereafter n type impurity ion is implanted, a shallow source-drain layer 6c and a deep diffusion resistance layer 6b are formed. According to such a constitution, the IC having the impurity layers of different depth can be obtained while eliminating a troublesome processing such as increasing of diffusion process or mask alignment, etc. |
申请公布号 |
JPS57153462(A) |
申请公布日期 |
1982.09.22 |
申请号 |
JP19810041407 |
申请日期 |
1981.03.18 |
申请人 |
MITSUBISHI DENKI KK |
发明人 |
SATOU SHINICHI;KOTANI HIDEO;DENDA MASAHIKO;OOHAYASHI YOSHIKAZU;MIZUGUCHI KAZUO |
分类号 |
H01L27/04;H01L21/265;H01L21/266;H01L21/28;H01L21/306;H01L21/822;H01L21/8234;H01L27/06;H01L29/78 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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