发明名称 |
Polarimeter arrangement for measuring polarisation plane rotation - has half wave delay plate with electrical rotation of main optical axis |
摘要 |
A polarimeter arrangement contains a half wave delay plate (20) in the beam path of a light beam (10, 11). The plate has an electrical arrangement (22) for rotating its main optical axis at a defined rate of rotation. The half wave plate can be physically rotated or can have electro-optically rotatable main optical axes. The electrical rotation arrangement is associated with a device for deriving a phase reference signal (RS). USE/ADVANTAGE - Measuring rotation of polarisation plane of linearly polarised light beam in measurement path (7) using heterodyne method and tehcnically simple rotation technique.
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申请公布号 |
DE3931543(A1) |
申请公布日期 |
1991.04.04 |
申请号 |
DE19893931543 |
申请日期 |
1989.09.21 |
申请人 |
SIEMENS AG, 1000 BERLIN UND 8000 MUENCHEN, DE |
发明人 |
BOSSELMANN, THOMAS, DR., 8520 ERLANGEN, DE |
分类号 |
G01J4/04;G01J9/04;G01R15/24 |
主分类号 |
G01J4/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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