发明名称 Polarimeter arrangement for measuring polarisation plane rotation - has half wave delay plate with electrical rotation of main optical axis
摘要 A polarimeter arrangement contains a half wave delay plate (20) in the beam path of a light beam (10, 11). The plate has an electrical arrangement (22) for rotating its main optical axis at a defined rate of rotation. The half wave plate can be physically rotated or can have electro-optically rotatable main optical axes. The electrical rotation arrangement is associated with a device for deriving a phase reference signal (RS). USE/ADVANTAGE - Measuring rotation of polarisation plane of linearly polarised light beam in measurement path (7) using heterodyne method and tehcnically simple rotation technique.
申请公布号 DE3931543(A1) 申请公布日期 1991.04.04
申请号 DE19893931543 申请日期 1989.09.21
申请人 SIEMENS AG, 1000 BERLIN UND 8000 MUENCHEN, DE 发明人 BOSSELMANN, THOMAS, DR., 8520 ERLANGEN, DE
分类号 G01J4/04;G01J9/04;G01R15/24 主分类号 G01J4/04
代理机构 代理人
主权项
地址