发明名称 FORMATION OF PROTECTIVE FILM OF REFLECTING SURFACE OF SEMICONDUCTOR LASER
摘要 PURPOSE:To elevate a COD level and to obtain a high output by using the anodizing film of semiconductor itself as a reflecting-surface protective film. CONSTITUTION:Laser end-faces are anodized and the anodizing films 5 of semiconductor itself are acquired in a clad layer 1, in which light and currents arc confined on laser operation, an active layer 2, in which light is generated, the reflecting surfaces 3 of a laser and reflecting-surface protective films 4. The thickness of the anodizing film 5 is thinned extremely as approximately several dozen or one hundred Angstrom . The thickness of the anodizing film 5 is thinned extremely because the reflectivity of the laser end-face is not subject to the influence in order to control the reflectivity of the laser end-face by the reflecting-surface protective film 4.
申请公布号 JPH0376184(A) 申请公布日期 1991.04.02
申请号 JP19890211721 申请日期 1989.08.17
申请人 MITSUBISHI ELECTRIC CORP 发明人 ARIMOTO SATOSHI
分类号 H01S5/00;H01S5/028 主分类号 H01S5/00
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