发明名称 Method of forming isolation region in integrated circuit semiconductor device
摘要 A method of manufacturing an isolation region including a field oxide layer and a channel stopper impurity region is disclosed. The channel stopper impurity region is formed after forming the field oxide layer by introducing ions of impurity at a portion of the substrate through the field oxide layer by ion-implantation manner.
申请公布号 US5004701(A) 申请公布日期 1991.04.02
申请号 US19890303721 申请日期 1989.01.27
申请人 NEC CORPORATION 发明人 MOTOKAWA, KAZUMASU
分类号 H01L21/76;H01L21/762;H01L27/108 主分类号 H01L21/76
代理机构 代理人
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