发明名称 SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURE THEREOF
摘要 The method for preventing a short between the conductor connecting a switching transistor to a capacitor and the conductor for the gate of switching transistor, comprises the steps: forming a first trench (4) with thick insulating film (5) and a second trench (6) with thin insulating film (8); filling a polysilicon (9) into the first and second trenches (4,6) to form a capacitor and etching the upside of the thick insulating film (5); filling a polysilicon (11) therein and planarizing the surface of the substrate; and forming the source and drain region (18) of the transistor connected through the side wall of the polysilicon (11).
申请公布号 KR910002040(B1) 申请公布日期 1991.03.30
申请号 KR19880002800 申请日期 1988.03.17
申请人 SAM SUNG ELECTRONICS CO.,LTD. 发明人 KANG TAE-KOO;SHIN YUN-SEUNG
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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