| 摘要 |
PURPOSE:To test a specified circuit in a short period of time by selectively outputting execution processing data, which are related to a first output data, and execution processing data related to a second output data based on an external control signal. CONSTITUTION:By an external control signal S showing a test mode, input data DIN are processed by time division and processing execution data MD2 related to the second output data D2 are read out of a storing means 13. Based on the processing execution data MD2, data processing in the middle of a series of control flow is executed through a control means 15. By the external control signal S showing a normal use mode, processing execution data MD1 related to first output data D2 are read out of the storing means 13 and based on the processing execution data MD1, processing at the time of normal use is executed through the control means 15. Thus, data processing related to the specified circuit can be tested in a short period of time. |
