| 摘要 |
A method and an apparatus for high-precision scattered light measurements characterized in that: in the optical path of a laser beam from the laser light source, the cross section of the laser beam is adjusted, and the laser beam is irradiated into a specimen fixed relatively to the laser beam to cause scattered lights to be scattered from the specimen; the angular distribution of the scattered lights is measured by adjusting the cross section for observing the scattered light in the optical path of the scattered light and scanning relatively with the specimen as its center; and by obtaining rapid and minute changes in the scattering intensities against minute changes in the scattering angles caused by the minute ununiformity in the structure of the specimen, the optical characteristics of transparent materials are evaluated. <IMAGE> |
