发明名称 Soft x-ray reduction camera for submicron lithography
摘要 Soft x-ray projection lithography can be performed using x-ray optical components and spherical imaging lenses (mirrors), which form an x-ray reduction camera. The x-ray reduction is capable of projecting a 5x demagnified image of a mask onto a resist coated wafer using 4.5 nm radiation. The diffraction limited resolution of this design is about 135 nm with a depth of field of about 2.8 microns and a field of view of 0.2 cm2. X-ray reflecting masks (patterned x-ray multilayer mirrors) which are fabricated on thick substrates and can be made relatively distortion free are used, with a laser produced plasma for the source. Higher resolution and/or larger areas are possible by varying the optic figures of the components and source characteristics.
申请公布号 US5003567(A) 申请公布日期 1991.03.26
申请号 US19890308332 申请日期 1989.02.09
申请人 HAWRYLUK, ANDREW M.;SEPPALA, LYNN G. 发明人 HAWRYLUK, ANDREW M.;SEPPALA, LYNN G.
分类号 G02B17/06;G03F7/20 主分类号 G02B17/06
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