发明名称 |
Soft x-ray reduction camera for submicron lithography |
摘要 |
Soft x-ray projection lithography can be performed using x-ray optical components and spherical imaging lenses (mirrors), which form an x-ray reduction camera. The x-ray reduction is capable of projecting a 5x demagnified image of a mask onto a resist coated wafer using 4.5 nm radiation. The diffraction limited resolution of this design is about 135 nm with a depth of field of about 2.8 microns and a field of view of 0.2 cm2. X-ray reflecting masks (patterned x-ray multilayer mirrors) which are fabricated on thick substrates and can be made relatively distortion free are used, with a laser produced plasma for the source. Higher resolution and/or larger areas are possible by varying the optic figures of the components and source characteristics.
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申请公布号 |
US5003567(A) |
申请公布日期 |
1991.03.26 |
申请号 |
US19890308332 |
申请日期 |
1989.02.09 |
申请人 |
HAWRYLUK, ANDREW M.;SEPPALA, LYNN G. |
发明人 |
HAWRYLUK, ANDREW M.;SEPPALA, LYNN G. |
分类号 |
G02B17/06;G03F7/20 |
主分类号 |
G02B17/06 |
代理机构 |
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代理人 |
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地址 |
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