发明名称 |
MULTILAYER METALLIZATION METHOD FOR INTEGRATED CIRCUITS |
摘要 |
Metal contacts and interconnections for semiconductor integrated circuits are fabricated through the deposition of a sandwich structure of metal. The bottom layer of a refractory metal prevents aluminum spiking into silicon; the top layer of refractory metal or alloy serves to reduce hillocking of the middle layer of conductive material. The upper-layer of refractory metal at the location of the contact pads is etched off to improve bonding during packaging. 0363I |
申请公布号 |
CA1282188(C) |
申请公布日期 |
1991.03.26 |
申请号 |
CA19880564675 |
申请日期 |
1988.04.21 |
申请人 |
STANDARD MICROSYSTEMS CORPORATION |
发明人 |
US, NATASHA;KIM, BONGGI;BERG, JOHN E. |
分类号 |
H01L23/52;H01L21/3205;H01L21/768;H01L23/532 |
主分类号 |
H01L23/52 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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